Abstract: In this study, shielding of radiation from a mobile phone towards user is analyzed. It includes both simulations of shielding of EM wave radiated from mobile phone and practically shielding measurements. Copper plate as a good conductor is utilized for shielding. Since the radiation mostly penetrates via user’s ear, the shield is placed on the earpiece of the mobile phone. For simulations, a Finite Difference Time Domain (FDTD) program has been developed in Matlab programming language. FDTD simulations have been carried out in 2 dimensions with first order Mur’s ABC. Shielding effectiveness (SE) values have been computed by using electric field values which the user is exposed to. Also electromagnetic radiation graphics with color code and field patterns can be showed as simulation outputs. Experimental measurements are carried out in an ordinary room. A radiation-meter and a mobile phone with internal antenna are used for these measurements. The results obtained from both simulations and measurements are compared.
Seyfi, L., & Yaldiz, E. (2008). Shielding performance of a mobile phone’s radiation with a good conductor. The International Conference on Electrical Engineering, 6(6th International Conference on Electrical Engineering ICEENG 2008), 1-12. doi: 10.21608/iceeng.2008.34307
MLA
Levent Seyfi; Ercan Yaldiz. "Shielding performance of a mobile phone’s radiation with a good conductor", The International Conference on Electrical Engineering, 6, 6th International Conference on Electrical Engineering ICEENG 2008, 2008, 1-12. doi: 10.21608/iceeng.2008.34307
HARVARD
Seyfi, L., Yaldiz, E. (2008). 'Shielding performance of a mobile phone’s radiation with a good conductor', The International Conference on Electrical Engineering, 6(6th International Conference on Electrical Engineering ICEENG 2008), pp. 1-12. doi: 10.21608/iceeng.2008.34307
VANCOUVER
Seyfi, L., Yaldiz, E. Shielding performance of a mobile phone’s radiation with a good conductor. The International Conference on Electrical Engineering, 2008; 6(6th International Conference on Electrical Engineering ICEENG 2008): 1-12. doi: 10.21608/iceeng.2008.34307