Document Type : Original Article
Authors
1 Student member, IEEE., A. Hosny is a Doctoral Candidate at the State University of New York at Buffalo, Amherst, NY 14260 USA. Phone: 716 645 3115 ext. 1204; Fax: 716 645 365.
2 Fellow, IEEE., M. Safiuddin is with the Department of Electrical Engineering, University at Buffalo, Amherst, NY 14260 USA.
Abstract
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